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Vortrag
In-line metrology and control towards zero defect manufacturing of Organic Electronics
02.03.2023 von 11:50 - 12:10
ICM Saal 13b
Sprache: Englisch
Vortragsart: Oral Presentation
Vortragsbeschreibung
Challenges of large scale manufacturing of OPVs
Novel in-line metrology tools in pilot-to-production line (hardware, software)
Zero-defect manufacturing for fully printed OPVs
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